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Table 4 Summary of the Scheirer–Ray–Hare test and effect sizes

From: Learning Factories 4.0 in technical vocational schools: can they foster competence development?

  LOI Time LOI × Time
df SS H p η2 df SS H p η2 df SS H p η2
HD 2 37,623 13.57 0.001 0.072 2 5070 1.83 0.401 0.009 4 6875 2.48 0.648 0.013
CU 2 87,805 29.98 0.000 0.159 2 7747 2.65 0.267 0.014 4 17,264 5.89 0.207 0.031
IL 2 85,102 28.54 0.000 0.151 2 937 0.31 0.855 0.002 4 4807 1.61 0.807 0.008
DS 2 140,440 47.14 0.000 0.251 2 1054 0.35 0.838 0.002 4 22,695 7.62 0.107 0.041
CL 2 50,154 17.10 1.94e−4 0.091 2 60,032 20.47 3.6e−5 0.108 4 24,037 8.19 0.084 0.044
PS 2 99,392 33.31 0.000 0.177 2 6028 2.02 0.364 0.010 4 28,812 9.66 0.047 0.051
MDC 2 141,369 47.25 0.000 0.251 2 16,700 5.58 0.061 0.029 4 10,091 3.37 0.497 0.018
STC 2 1610 0.54 0.763 0.003 2 99,461 33.36 0.000 0.177 4 44,361 14.88 0.005 0.079
  1. df Degrees of freedom, SS sum of squares, H H-test, p probability, η2 Generalized eta squared effect size, HD handling digital devices, CU content use, IL information literacy, DS digital security, CL collaboration, PS problem solving, MDC multidisciplinary digital competencies, STC subject-related technical competencies