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Table 4 Summary of the Scheirer–Ray–Hare test and effect sizes

From: Learning Factories 4.0 in technical vocational schools: can they foster competence development?

 

LOI

Time

LOI × Time

df

SS

H

p

η2

df

SS

H

p

η2

df

SS

H

p

η2

HD

2

37,623

13.57

0.001

0.072

2

5070

1.83

0.401

0.009

4

6875

2.48

0.648

0.013

CU

2

87,805

29.98

0.000

0.159

2

7747

2.65

0.267

0.014

4

17,264

5.89

0.207

0.031

IL

2

85,102

28.54

0.000

0.151

2

937

0.31

0.855

0.002

4

4807

1.61

0.807

0.008

DS

2

140,440

47.14

0.000

0.251

2

1054

0.35

0.838

0.002

4

22,695

7.62

0.107

0.041

CL

2

50,154

17.10

1.94e−4

0.091

2

60,032

20.47

3.6e−5

0.108

4

24,037

8.19

0.084

0.044

PS

2

99,392

33.31

0.000

0.177

2

6028

2.02

0.364

0.010

4

28,812

9.66

0.047

0.051

MDC

2

141,369

47.25

0.000

0.251

2

16,700

5.58

0.061

0.029

4

10,091

3.37

0.497

0.018

STC

2

1610

0.54

0.763

0.003

2

99,461

33.36

0.000

0.177

4

44,361

14.88

0.005

0.079

  1. df Degrees of freedom, SS sum of squares, H H-test, p probability, η2 Generalized eta squared effect size, HD handling digital devices, CU content use, IL information literacy, DS digital security, CL collaboration, PS problem solving, MDC multidisciplinary digital competencies, STC subject-related technical competencies